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Power-Constrained Testing of VLSI Circuits (English, Nicola Nicolici | Bashir M. Al-Hashimi) - Image 1 - GlowMirror

Power-Constrained Testing of VLSI Circuits (English, Nicola Nicolici | Bashir M. Al-Hashimi)

by Nicola Nicolici | Bashir M. Al-Hashimi

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Book Details

Publisher
Springer
Language
English
ISBN-13
9781402072352
ISBN-10
140207235X
Author
Nicola Nicolici | Bashir M. Al-Hashimi

About the Book

Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-i…

ISBN: 9781402072352

ISBN-13: 9781402072352
ISBN-10: 140207235X

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ISBN-10: 140207235X. ISBN-13: 9781402072352. Power-Constrained Testing of VLSI Circuits (English, Nicola Nicolici | Bashir M. Al-Hashimi) by Nicola Nicolici | Bashir M. Al-Hashimi. Available on GlowMirror.
Product ID: isbn-9781402072352