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Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces (English, Weronika Walkosz)
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Specifications
| Publisher | Springer |
| Language | English |
| ISBN-13 | 9781441978165 |
| ISBN-10 | 144197816X |
| Author | Weronika Walkosz |
Product Description
About the Book
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β - Si 3 N 4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an impo…
ISBN: 9781441978165
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- ·In-depth exploration of topics covered in Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces
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Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces is authored by Weronika Walkosz.
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About the Book
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β - Si 3 N 4 a...
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