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Reflection Electron Microscopy and Spectroscopy for Surface Analysis (English, Zhong Lin Wang | Wang Zhong Lin) - Image 1 - GlowMirror

Reflection Electron Microscopy and Spectroscopy for Surface Analysis (English, Zhong Lin Wang | Wang Zhong Lin)

by Zhong Lin Wang | Wang Zhong Lin

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Book Details

Publisher
Cambridge University Press
Language
English
ISBN-13
9780521017954
ISBN-10
0521017955
Author
Zhong Lin Wang | Wang Zhong Lin

About the Book

This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials sc…

ISBN: 9780521017954

ISBN-13: 9780521017954
ISBN-10: 0521017955

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis starts from ₹4606 at GlowMirror. Available in Paperback.
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Zhong Lin Wang | Wang Zhong Lin is the author of Reflection Electron Microscopy and Spectroscopy for Surface Analysis. Browse more books by Zhong Lin Wang | Wang Zhong Lin on GlowMirror.
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ISBN-10: 0521017955. ISBN-13: 9780521017954. Reflection Electron Microscopy and Spectroscopy for Surface Analysis (English, Zhong Lin Wang | Wang Zhong Lin) by Zhong Lin Wang | Wang Zhong Lin. Available on GlowMirror.
Product ID: isbn-9780521017954