Computers & Internet
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science
₹8,682
Inclusive of all applicable taxes. Free shipping on orders above ₹499, else ₹49 flat.
Quantity:
1
Free DeliveryOn orders above ₹499
15-Day ReturnEasy returns
Verified ListingQuality-checked
Available Offers
- 🚚Free Delivery — Free on orders above ₹499, else ₹49 flat
- 💵Cash on Delivery — Pay when your order arrives
- ↩️15-Day Easy Returns — Hassle-free return policy
- 🔒Cash on Delivery — Pay safely when your order arrives
Check Delivery
Specifications
| author | Bhattacharya, Debashis; Hayes, John P. |
| publisher | Springer |
| isbn13 | 9780792390589 |
| isbn10 | 079239058X |
| binding | hardcover |
| language | english |
| edition | 1990 ed. |
| pages | 160 |
Product Description
Here on GlowMirror, you'll find Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science filed under Computers & Internet -- everything you need to know is covered below.
About this book
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. published by Springer.
Related topics
COMPUTER, Computer/General, Monograph Series, any, Multiplexer, Signal, VLSI, algorithms.
Book Insights
What You'll Learn
- ·Fundamental and advanced concepts in Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science
- ·Code examples, algorithms, and implementation patterns
- ·Best practices and industry-relevant skills
Who Should Read This
Software developers, IT professionals, computer science students, and tech enthusiasts.
Key Highlights
- ·Brand new physical book delivered across India
- ·15-day hassle-free return policy
Frequently Asked Questions
What is the price of Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science?
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science is available at ₹8,682 on GlowMirror.
Does GlowMirror offer free delivery for Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science?
GlowMirror offers free delivery on orders above ₹499. For Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science priced at ₹8,682, you qualify for free shipping.
Is Cash on Delivery available for Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science?
Yes, Cash on Delivery (COD) is available for Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science on GlowMirror across India. Pay conveniently when your order arrives.
What is the return policy for Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science?
GlowMirror offers a 15-day hassle-free return policy for Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science. Returns are free of charge. Contact us at info@glowmirror.in or call +91 99446 78357 to initiate a return.
Is Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science available in English?
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science is available in english on GlowMirror.
Who is the author of Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science?
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science is authored by Bhattacharya, Debashis; Hayes, John P..
Who published Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science?
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science is published by Springer.
How many pages does Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science have?
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science has 160 pages.
How long does it take to read Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science?
At an average reading speed of 250 words per minute, reading Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science takes approximately 4 hours.
What is Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science about?
About this book
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. published by Springer.
Related topics
COMPUTER, Computer/General, Monograph Series, any, Multiplexer, Signal, VLSI, al...
Is Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science suitable for beginners?
Whether Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science is suitable for beginners depends on your background in Computers & Internet. Review the product description and specifications above for details on the target audience and difficulty level.
What edition is Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science?
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science is from the Springer edition/year. Check the specifications section for full edition details.
How do I order Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science on GlowMirror?
To order Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science on GlowMirror, click the "Add to Cart" button on this page, proceed to checkout, and choose your preferred payment method — online payment or Cash on Delivery. Delivery takes 2–7 business days across India.
Is Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science a new or used book?
Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science listed on GlowMirror is a brand new book in good condition.
Can I get Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science delivered across India?
Yes, GlowMirror delivers Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science) by Bhattacharya, Debashis; Hayes, John P. | Hardcover | Computer Science across India. Use the pincode checker on this page to verify delivery availability to your location.
![Practical Hacking Techniques and Countermeasures [With CDROM] (English, Mark D. Spivey)](/_next/image?url=https%3A%2F%2Fglowmirror.in%2Fimages%2Fproducts%2F9780849370571.webp&w=3840&q=75)
