-66% OFFFocused Ion Beam Systems (English, Nan Yao)
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Specifications
| Publisher | Cambridge University Press |
| Language | English |
| ISBN-13 | 9780521831994 |
| ISBN-10 | 0521831997 |
| Author | Nan Yao |
Product Description
Here on GlowMirror, you'll find Focused Ion Beam Systems filed under Cambridge University Press -- everything you need to know is covered below.
About the Book
The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers t…
ISBN: 9780521831994
Book Insights
What You'll Learn
- ·In-depth exploration of topics covered in Focused Ion Beam Systems
- ·Key concepts explained with clarity and practical examples
- ·Insights valuable for anyone studying or working in Cambridge University Press
Who Should Read This
Students and professionals interested in Cambridge University Press, as well as general readers looking to expand their knowledge.
Key Highlights
- ·Brand new physical book delivered across India
- ·15-day hassle-free return policy





