Books
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering
₹6,083
Inclusive of all applicable taxes. Free shipping on orders above ₹499, else ₹49 flat.
Quantity:
1
Free DeliveryOn orders above ₹499
15-Day ReturnEasy returns
Verified ListingQuality-checked
Available Offers
- 🚚Free Delivery — Free on orders above ₹499, else ₹49 flat
- 💵Cash on Delivery — Pay when your order arrives
- ↩️15-Day Easy Returns — Hassle-free return policy
- 🔒Cash on Delivery — Pay safely when your order arrives
Check Delivery
Specifications
| author | Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix |
| publisher | Springer Nature |
| isbn13 | 9789811044328 |
| isbn10 | 9811044325 |
| binding | paperback |
| language | english |
| edition | 2018 ed. |
| pages | 137 |
Product Description
Here on GlowMirror, you'll find Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering filed under Books -- everything you need to know is covered below.
About this book
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix published by Springer Nature.
Related topics
Field emission gun technologies, Ionic liquid treatment, Dual in-lens electron detection, Low voltage SEM, X-ray imaging, Silicon drift detector, Electron Channeling Contrast Imaging, Electron Backscatter Diffraction.
Book Insights
What You'll Learn
- ·In-depth exploration of topics covered in Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering
- ·Key concepts explained with clarity and practical examples
- ·Insights valuable for anyone studying or working in Books
Who Should Read This
Students and professionals interested in Books, as well as general readers looking to expand their knowledge.
Key Highlights
- ·Brand new physical book delivered across India
- ·15-day hassle-free return policy
Frequently Asked Questions
What is the price of Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering?
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering is available at ₹6,083 on GlowMirror.
Does GlowMirror offer free delivery for Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering?
GlowMirror offers free delivery on orders above ₹499. For Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering priced at ₹6,083, you qualify for free shipping.
Is Cash on Delivery available for Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering?
Yes, Cash on Delivery (COD) is available for Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering on GlowMirror across India. Pay conveniently when your order arrives.
What is the return policy for Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering?
GlowMirror offers a 15-day hassle-free return policy for Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering. Returns are free of charge. Contact us at info@glowmirror.in or call +91 99446 78357 to initiate a return.
Is Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering available in English?
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering is available in english on GlowMirror.
Who is the author of Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering?
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering is authored by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix.
Who published Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering?
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering is published by Springer Nature.
How many pages does Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering have?
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering has 137 pages.
How long does it take to read Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering?
At an average reading speed of 250 words per minute, reading Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering takes approximately 3 hours.
What is Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering about?
About this book
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix published by Springer Nature.
Related topics
Field emission gun technologies, Ionic...
Is Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering suitable for beginners?
Whether Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering is suitable for beginners depends on your background in Books. Review the product description and specifications above for details on the target audience and difficulty level.
What edition is Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering?
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering is from the Springer Nature edition/year. Check the specifications section for full edition details.
How do I order Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering on GlowMirror?
To order Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering on GlowMirror, click the "Add to Cart" button on this page, proceed to checkout, and choose your preferred payment method — online payment or Cash on Delivery. Delivery takes 2–7 business days across India.
Is Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering a new or used book?
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering listed on GlowMirror is a brand new book in good condition.
Can I get Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering delivered across India?
Yes, GlowMirror delivers Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) by Brodusch, Nicolas; Gauvin, Raynald; Demers, Hendrix | Paperback | Technology & Engineering across India. Use the pincode checker on this page to verify delivery availability to your location.
![A Grammar of Aguaruna (Iiniá Chicham): 68 (Mouton Grammar Library [MGL], 68) by Overall, Simon E. | Hardcover | Linguistics](/_next/image?url=%2Fapi%2Fimg%3Furl%3Dhttps%253A%252F%252Fm.media-amazon.com%252Fimages%252FI%252F316gQmdPkiL.jpg&w=3840&q=75)
![A Grammar of Emai: 72 (Mouton Grammar Library [MGL], 72) by Schaefer, Ronald P.; Egbokhare, Francis O. | Hardcover | Linguistics](/_next/image?url=%2Fapi%2Fimg%3Furl%3Dhttps%253A%252F%252Fm.media-amazon.com%252Fimages%252FI%252F31dDAz5Qk9L.jpg&w=3840&q=75)
