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Design and Test Technology for Dependable Systems-on-Chip (English, Raimund Ubar | Jaan Raik | Heinrich Theodor Vierhaus)
Information Science Reference

Design and Test Technology for Dependable Systems-on-Chip (English, Raimund Ubar | Jaan Raik | Heinrich Theodor Vierhaus)

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Specifications

PublisherInformation Science Reference
LanguageEnglish
ISBN-139781609602123
ISBN-101609602129
AuthorRaimund Ubar | Jaan Raik | Heinrich Theodor Vierhaus

Product Description

About the Book

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Mul…

ISBN: 9781609602123

Book Insights

What You'll Learn

  • ·In-depth exploration of topics covered in Design and Test Technology for Dependable Systems-on-Chip
  • ·Key concepts explained with clarity and practical examples
  • ·Insights valuable for anyone studying or working in Information Science Reference

Who Should Read This

Science students, researchers, and curious minds of all ages.

Key Highlights

  • ·Brand new physical book delivered across India
  • ·15-day hassle-free return policy

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Is Design and Test Technology for Dependable Systems-on-Chip available in English?
Design and Test Technology for Dependable Systems-on-Chip is available in English on GlowMirror.
Who is the author of Design and Test Technology for Dependable Systems-on-Chip?
Design and Test Technology for Dependable Systems-on-Chip is authored by Raimund Ubar | Jaan Raik | Heinrich Theodor Vierhaus.
Who published Design and Test Technology for Dependable Systems-on-Chip?
Design and Test Technology for Dependable Systems-on-Chip is published by Information Science Reference.
How many pages does Design and Test Technology for Dependable Systems-on-Chip have?
Page count information for Design and Test Technology for Dependable Systems-on-Chip is available in the specifications section of this page.
How long does it take to read Design and Test Technology for Dependable Systems-on-Chip?
At an average reading speed of 250 words per minute, reading Design and Test Technology for Dependable Systems-on-Chip takes a few hours to a few days depending on reading pace.
What is Design and Test Technology for Dependable Systems-on-Chip about?
About the Book Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system d...
Is Design and Test Technology for Dependable Systems-on-Chip suitable for beginners?
Whether Design and Test Technology for Dependable Systems-on-Chip is suitable for beginners depends on your background in Information Science Reference. Review the product description and specifications above for details on the target audience and difficulty level.
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Design and Test Technology for Dependable Systems-on-Chip is from the Information Science Reference edition/year. Check the specifications section for full edition details.
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