Art History
Design and Test Technology for Dependable Systems-on-Chip (English, Raimund Ubar | Jaan Raik | Heinrich Theodor Vierhaus)
by Raimund Ubar | Jaan Raik | Heinrich Theodor Vierhaus
Publisher: Information Science Reference
Language: English
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Specifications
| Publisher | Information Science Reference |
| Language | English |
| ISBN-13 | 9781609602123 |
| ISBN-10 | 1609602129 |
| Author | Raimund Ubar | Jaan Raik | Heinrich Theodor Vierhaus |
Product Description
Here on GlowMirror, you'll find Design and Test Technology for Dependable Systems-on-Chip filed under Art History -- everything you need to know is covered below.
About the Book
Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Mul…
ISBN: 9781609602123
Book Insights
What You'll Learn
- ·Key historical events and figures covered in Design and Test Technology for Dependable Systems-on-Chip
- ·Primary sources, analysis, and historiographical perspectives
- ·Connections between past events and their modern relevance
Who Should Read This
History buffs, students, and readers curious about the past.
Key Highlights
- ·Brand new physical book delivered across India
- ·15-day hassle-free return policy
Frequently Asked Questions
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Is Design and Test Technology for Dependable Systems-on-Chip available in English?
Design and Test Technology for Dependable Systems-on-Chip is available in English on GlowMirror.
Who is the author of Design and Test Technology for Dependable Systems-on-Chip?
Design and Test Technology for Dependable Systems-on-Chip is authored by Raimund Ubar | Jaan Raik | Heinrich Theodor Vierhaus.
Who published Design and Test Technology for Dependable Systems-on-Chip?
Design and Test Technology for Dependable Systems-on-Chip is published by Information Science Reference.
How many pages does Design and Test Technology for Dependable Systems-on-Chip have?
Page count information for Design and Test Technology for Dependable Systems-on-Chip is available in the specifications section of this page.
How long does it take to read Design and Test Technology for Dependable Systems-on-Chip?
At an average reading speed of 250 words per minute, reading Design and Test Technology for Dependable Systems-on-Chip takes a few hours to a few days depending on reading pace.
What is Design and Test Technology for Dependable Systems-on-Chip about?
About the Book
Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system d...
Is Design and Test Technology for Dependable Systems-on-Chip suitable for beginners?
Whether Design and Test Technology for Dependable Systems-on-Chip is suitable for beginners depends on your background in Art History. Review the product description and specifications above for details on the target audience and difficulty level.
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Design and Test Technology for Dependable Systems-on-Chip is from the Information Science Reference edition/year. Check the specifications section for full edition details.
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