-20% OFFAtom-Probe Field Ion Microscopy (English, Tien T. Tsong)
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Specifications
| Publisher | Cambridge University Press |
| Language | English |
| ISBN-13 | 9780521019934 |
| ISBN-10 | 0521019931 |
| Author | Tien T. Tsong |
Product Description
Here on GlowMirror, you'll find Atom-Probe Field Ion Microscopy filed under Cambridge University Press -- everything you need to know is covered below.
About the Book
Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have b…
ISBN: 9780521019934
Book Insights
What You'll Learn
- ·In-depth exploration of topics covered in Atom-Probe Field Ion Microscopy
- ·Key concepts explained with clarity and practical examples
- ·Insights valuable for anyone studying or working in Cambridge University Press
Who Should Read This
Students and professionals interested in Cambridge University Press, as well as general readers looking to expand their knowledge.
Key Highlights
- ·Brand new physical book delivered across India
- ·15-day hassle-free return policy





