Value Analysis Tear-down: A New Process for Product Development and Innovation (English, Hardcover, J. Jerry Kaufman, Yoshihiko Sato)
by J. Jerry Kaufman, Yoshihiko Sato
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Book Details
About the Book
This book presents, for the first time, a new technology for improving products and innovating new and better products, first developed in Japan by Yoshihiko Sato. Value analysis tear-down combines traditional tear-down with the technologies of value analysis and value engineering. Within a few year...
Why You Should Read This Book
- Written by acclaimed authors J. Jerry Kaufman, Yoshihiko Sato
- Published by Industrial Press Inc.,U.S. (2005)
- 206 pages of comprehensive content
- Available in English language
- Ideal for students, professionals, and avid readers
Product Details
This edition of Value Analysis Tear-down: A New Process for Product Development and Innovation is published by Industrial Press Inc.,U.S. and was first released in 2005. The book contains 206 pages packed with valuable information. It is available in multiple formats including Paperback and Hardcover editions, making it convenient for all types of readers.
Who Is This Book For?
Whether you are a student, a professional looking to expand your knowledge, or simply someone who loves reading, Value Analysis Tear-down: A New Process for Product Development and Innovation by J. Jerry Kaufman, Yoshihiko Sato is an excellent choice. Order your copy today from BookBajar and enjoy free shipping with Cash on Delivery option available across India.
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